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  • Growth in RTA @800°C by 290s, then etching, this data corresponds to the last etching at 1800s. ARXPS 0-65°

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    Files :

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Si wafer

    • Elements: Si2p

    • Sample composition: SiOx

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0-65

    Equipment and analysis software:

    • Brand: SPECS

    • Model: Phoibos 150

    • Spectrometer mode: MediumArea:1.5kV

    • Software used: Analyzer

    grapth.png
  • Database

    Data from Vince Crist (https://xpslibrary.com/b-vincent-crist-ceo/). The spectrum is good enough to determine the Lorentzian width, which resulted different from bulk silicon. (US Government data copyright number TX 4-560-881.)

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    Information about the sample:

    • Sample material: Quartz

    • Elements: Si, O

    • Sample composition: SiO2

    Equipment and analysis software:

    • Brand: Kratos

    • Software used: Analyzer

    Some_image
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    Files :

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    Information about the sample:

    • Shape: Nanowires

    • Sample material: SiO2

    • Elements: Si,O

    • Sample composition: SiO2

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha110

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

    .jpeg
  • Database

    The red, fushia, and olive-green peaks correspond to the 1+, 2+, and 3+ suboxides (parameters from Himpsel et al. Surf. Inter. Anal. 21. 44-50 (1994)). The green peak is the ST peak described in the paper titled "The ST component in the Si 2p photoemission spectrum from clean and oxidized Si [001] surfaces" (to be publish).

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    Files :

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: silicon oxide layer

    • Elements: Si, O

    • Sample composition: SiO2, Si

    .jpeg
  • This post is for a peak-fitting test for students of the Universidad Autonoma de Queretaro.

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    Files :

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    Information about the sample:

    • Shape: Flat surface

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    p_Si 2p with one plasmon.fil.jpeg
  • Fitting exercise for the Material's Characterization Course at the Universidad Autónoma de Querétaro

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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: SiC on silicon

    • Elements: Si, C, O

    • Sample composition: SiC/Si

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Brand: ThermoFisher

    • Model: Alpha 110

    • Spectrometer mode: small area, large angle

    Some.png
  • this sample was prepared at 800 C and 145 seconds with oxygen flow at low pressure in the quartz tube

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    Files :

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Silicon wafer

    • Sample composition: SiO2

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Take-off angle: 5-65

    Equipment and analysis software:

    • Model: 110

    Some.png

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