• Growth in RTA @800°C by 290s, then etching, this data corresponds to the last etching at 1800s. ARXPS 0-65°

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Si wafer

    • Elements: Si2p

    • Sample composition: SiOx

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0-65

    Equipment and analysis software:

    • Brand: SPECS

    • Model: Phoibos 150

    • Spectrometer mode: MediumArea:1.5kV

    • Software used: Analyzer

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    Equipment and analysis software:

    • Software used: AAnalyzer

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  • Fitting of the Ge 3d photoemission spectrum for a single crystal surface, data were published by Lawson et al. (accession #0032903). The spectrum was fitted employing one Voigt doublet. The branching ratio was forced to be equal to the theoretically expected value (0.6865), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read less

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    Information about the sample:

    • Shape: Other :single crystal

    • Sample material: Germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • Fitting of the Ge 2p photoemission spectrum for a single crystal surface, data were published by Lawson et al. (accession #0032902). The spectrum was fitted employing one Voigt doublet. The branching ratio was forced to be equal to the theoretically expected value (0.5184), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read moreRead more

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • Fitting of the V 2p photoemission spectrum for a polycrystalline metallic surface, data were published by Lawson et al. (accession #0032402). The apparent asymmetry of the main photoemission line was modeled employing two symmetric Voigt doublets. Another three Voigt doublets were employed to optimize the fitting. The branching ratio of the five components was forced to be equal to the theoretically expected value (0.5165), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read less

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Polycrystalline metallic Vanadium

    • Elements: V

    • Sample composition: V

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • Fitting of the V 2p photoemission spectrum for a polycrystalline metallic surface, data were published by Lawson et al. (accession #0032902). The apparent asymmetry of the main photoemission line was modeled employing the Double-Lorentzian asymmetric line-shape. Another three Voigt doublets were employed to optimize the fitting. The branching ratio of the four components was forced to be equal to the theoretically expected value (0.5165), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read more

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Polycrystalline metallic Vanadium

    • Elements: V

    • Sample composition: V

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • Ru 3d metallic photoemission spectrum fitted. The data were published by Kaga et al. (accession #0041702). The film was deposited on a glass substrate by reactive sputtering. A signal from oxygen was detected in the sample but the area is too small to be associated with any of the Ru 3d peaks and a Ru oxide (under the MultiLayer Method, considering the formation of a top ruthenium oxide layer, the composition of the oxide is RuO0.2), which strongly suggests that the three Ru 3d peaks are metallic components and that the oxygen signal is associated with an adventitious species. The branching ratio of the three doublets was forced to be equal to the theoretically expected value (0.6901), which was taken from the Scofield tables. Department of Materials Science, Kitami Institute of Technology, 165 Koen-cho, Kitami 090-8507, Japan, "Ru and RuO2 Thin Films by XPS", Surface Science Spectra 6, 68-74 (1999) https://doi.org/10.1116/1.1247890Read more

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Ru

    • Elements: Ru

    • Sample composition: Ru

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 23.5

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Physical Electronics, Inc.

    • Model: 1600

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • The photoemission spectrum for Rh 3d from a metallic thin film of rhodium was published by Abe et al. (accession #00651-02). Three Voigt doublets were employed to model the metallic components (no oxygen signal was detected in the survey spectra). The branching ratio of each doublet was forced to be equal to the theoretically expected value (0.6913) taken from the Scofield tables. Yoshio Abe, Kiyohiko Kato, Midori Kawamura, and Katsutaka Sasaki , "Rhodium and Rhodium Oxide Thin Films Characterized by XPS", Surface Science Spectra 8, 117-125 (2001) https://doi.org/10.1116/11.20010801Read more

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Rhodium

    • Elements: Rh

    • Sample composition: Rh

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 23.5

    • Take-off angle: 25

    Equipment and analysis software:

    • Brand: Physical Electronics, Inc.

    • Model: 1600

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • K 2p photoemission spectrum obtained from a KBr surface cleaved in air. The branching ratio of the two doublets were forced to be equal to the theoretically expected values, which were taken from the Scofield tables. The data were published by Vincent Crist. B. Vincent Crist, "KBr Crystal: Cleaved in Air", Surface Science Spectra 1, 292-296 (1992) https://doi.org/10.1116/1.1247654Read more

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Potassium bromide

    • Elements: K, Br

    • Sample composition: KBr

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 25

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Surface Science Instruments

    • Model: X-Probe 206

    • Spectrometer mode: constant pass energy

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  • Hf 4f spectrum obtained from a polycrystalline metallic hafnium foil, data were published by Arranz and Palacio (accession #00876-02). The branching ratio of each doublet was forced to be equal to the theoretically expected value taken from the Scofield Tables. A. Arranz and C. Palacio , "Core Level Spectra of Hafnium and Hafnium Nitride (HfN0.9) by XPS", Surface Science Spectra 11, 33-42 (2004) https://doi.org/10.1116/11.20050103

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Metallic Hf

    • Elements: Hf

    • Sample composition: Hf

    Data acquisition parameters:

    • Photon source: Mg Ka

    • Pass energy: 16

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: SPECS EA

    • Model: 10 model

    • Spectrometer mode: constant pass energy

    Some_image
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    Equipment and analysis software:

    • Software used: AAnalyzer

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  • Datos de oxigeno O1s para el curso de Principios de Caractrización

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    Equipment and analysis software:

    • Software used: Analyzer

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  • Database

    ZnO film deposited by sol-gel-method

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    Information about the sample:

    • Shape: Flat surface

    • Sample material: ZnO

    • Elements: O, Zn, C

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 15

    • Take-off angle: 90

    Equipment and analysis software:

    • Spectrometer mode: Standard

    O 1s_0.fil.jpeg
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    Information about the sample:

    • Shape: Flat surface

    • Sample material: Ag

    • Elements: Ag

    • Sample composition: Ag

    Data acquisition parameters:

    • Photon source: Al Ka monochromatic

    • Pass energy: 10

    • Take-off angle: 85

    Equipment and analysis software:

    • Spectrometer mode: MONOXPS

    • Software used: AAnalyzer

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  • Database

    Data from Vince Crist (https://xpslibrary.com/b-vincent-crist-ceo/). The spectrum is good enough to determine the Lorentzian width, which resulted different from bulk silicon. (US Government data copyright number TX 4-560-881.)

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    Information about the sample:

    • Sample material: Quartz

    • Elements: Si, O

    • Sample composition: SiO2

    Equipment and analysis software:

    • Brand: Kratos

    • Software used: Analyzer