• In the fitting parameters screen, I am not able to constrain areas to a certain range. If I input a range for the areas to be limited to, the area parameters simply go out of range every time I attempt to fit the peaks to the data. Has anyone else experienced this issue or discovered a fix for it? Also, please do not use the fitting uploaded with this post. It is incomplete and likely inaccurate.

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    Files :

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: ALD-Grown Cobalt Oxide

    • Elements: Co, O

    • Sample composition: Co3O4

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    Equipment and analysis software:

    • Brand: ULVAC-PHI

    • Model: VersaProbe III

    • Software used: Analyzer

  • Growth in RTA @800°C by 290s, then etching, this data corresponds to the last etching at 1800s. ARXPS 0-65°

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    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Si wafer

    • Elements: Si2p

    • Sample composition: SiOx

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0-65

    Equipment and analysis software:

    • Brand: SPECS

    • Model: Phoibos 150

    • Spectrometer mode: MediumArea:1.5kV

    • Software used: Analyzer

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    Files :

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    Equipment and analysis software:

    • Software used: AAnalyzer

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  • Fitting of the Ge 3d photoemission spectrum for a single crystal surface, data were published by Lawson et al. (accession #0032903). The spectrum was fitted employing one Voigt doublet. The branching ratio was forced to be equal to the theoretically expected value (0.6865), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read less

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    Files :

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    Information about the sample:

    • Shape: Other :single crystal

    • Sample material: Germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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  • Fitting of the Ge 2p photoemission spectrum for a single crystal surface, data were published by Lawson et al. (accession #0032902). The spectrum was fitted employing one Voigt doublet. The branching ratio was forced to be equal to the theoretically expected value (0.5184), which was taken from the Scofield tables. Lawson et al., "Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy", Surface Science Spectra 4, 316-344 (1996) https://doi.org/10.1116/1.1247829Read moreRead more

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    Files :

      You must be logged-in to download data

    Information about the sample:

    • Shape: Flat Surface

    • Sample material: Germanium

    • Elements: Ge

    • Sample composition: Ge

    Data acquisition parameters:

    • Photon source: Al Ka (monochromatic)

    • Pass energy: 20

    • Take-off angle: 0

    Equipment and analysis software:

    • Brand: Kratos Analytical, Manchester, UK

    • Model: AXIS HS

    • Spectrometer mode: constant pass energy

    • Software used: Analyzer

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