The most advanced methods for peak-fitting photoemission data are encompassed in AAnalyzer®. These are described in the five links below. With them, it is possible to obtain better fits and in a simpler way. Besides these methods, AAnalyzer® contains all the standard options of a photoemission fitting program (e.g., true Voigt functions, Doniach-Sunjic line shape, Shirley-Sherwood background, and the two and three-parameter Tougaard backgrounds, among others). All the parameters that it employs have a direct physical interpretation.
Advanced fitting methods unique to AAnalyzer®:
- Active Background
This is a very important tool in AAnalyzer® since it allows for a better modeling of the background. The active-background always provides better fits than the traditional method.
- Shirley-Vegh-Salvi-Castle background (or peak-Shirley background)
This is a variant of the Shirley-Sherwood background that does not require iterations and neither choosing two points. In this way, the fit and assessment of the peak areas become much less dependent on the operator.
- Slope Background
This is a Tougaard-type background that models in a very simply way the change on the slope of the background between the two sides of the peaks. In combinations with the Shirley background, provides excellent fits for a wide range of spectrum shapes.
- Double-Lorentzian Line Shape
This provides an excellent option to the Doniach-Sunjic line shape. In contrast, the double-Lorentzian line-shape is integrable, allowing for quantitative analysis of the peak areas.
- Simultaneous Fitting
This is an excellent tool for discriminating overlapping peaks. It reduces enormously the uncertainty on the peak parameters values.
All these features are easily available, giving the user the chance of taking advantage of them right away.