Related Events

 

 

  • Practical Application of ARXPS to Materials Characterization. A. Herrera-Gomez. CINVESTAV-Unidad Queretaro. Queretaro, 76230 Mexico. Invited Talk.

  • Monday Morning, October 29, 2012, 9:40am. Simplified Extrinsic Background for XPS Data Fitting, A. Herrera-Gomez.
  • Monday Afternoon, October 29, 2012, 4:40pm. AR-XPS Study of Al2O3/In-based IIIV Interfaces after Annealing under Vacuum at Low Temperature, E. Martinez, H. Grampeix, O. Desplats, CEA, LETI, MINATEC Campus, France, A. Herrera-Gomez, O. Ceballos-Sanchez, CINVESTAV-Unidad Queretaro, Mexico, J. Guerrero, K. Yckache, F. Martin, CEA, LETI, MINATEC Campus, France.
  • Tuesday Afternoon Poster Session. XPS Assessment of the Thickness of Fe Oxide Layers using Standard and Active Shirley Background, M. Bravo-Sanchez, CINVESTAV-Unidad Queretaro, Mexico, F. Espinosa-Magaña, CIMAV Unidad-Chihuahua, Mexico, A. Herrera-Gomez, UAM-Azcapotzalco and CINVESTAV-Queretaro, Mexico
  • Tuesday Afternoon Poster Session. Active Fitting for Optimized Shirley Background Determination, J. Muñoz-Flores, UAM-Xochimilco, Mexico, A. Herrera-Gomez, UAM-Azcapotzalco and CINVESTAV-Queretaro, Mexico

  • Friday, October 12, 2012, 10:30. A non-iterative Shirley-type background for XPS data peak-fitting. A. Herrera-Gomez. CINVESTAV-Unidad Queretaro. Queretaro, 76230 Mexico. Invited Talk.
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  • Tuesday Afternoon, September 25, 2012, 16:10. The Active Shirley Background in XPS Data Analysis for the Thickness Assesment of Fe Oxide Layers. Mariela Bravo-Sanchez, Francisco Espinosa-Magaña, Alberto Herrera-Gomez.
  • Tuesday Afternoon, September 25, 2012, 17:50. A simpler alternative to the Tougaard background for XPS data fitting. Alberto Herrera-Gomez.
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